Title: Methodology for Predicting Microelectronic Substrate Warpage Incorporating Copper Trace Pattern Characteristics When: Thursday, June 5, 2008 at 10:00 AM Where: MARC Building, Room 401
Blank Space (small)
(text and background only visible when logged in)
(text and background only visible when logged in)
Responding to COVID-19
The Georgia Tech community has joined in the battle against Covid-19, contributing our expertise, innovation, and indomitable spirit to the effort. We aim to keep you informed as our efforts evolve and our reach expands.