Dr. Kurfess is currently on leave at the Office of Science and Technology Policy of the Executive Office of the President of the United States of America.

Education

Ph.D. Massachusetts Institute of Technology, 1989
S.M. (EECS), Massachusetts Institute of Technology, 1988
S.M. (ME), Massachusetts Institute of Technology, 1987
S.B., Massachusetts Institute of Technology, 1986

Research

Dr. Kurfess' research focuses on the control of precision grinding systems that involve the development and implementation of adaptive controllers for precision grinding operations, including bore grinding, through feed centerless grinding and surface grinding. Ultrarigid machines tools with open architecture controls are employed. The results of this work are used in a number of industrial environments.

His project on precision measurement involves the use of coordinate measurement machines to verify part geometry in three dimensions. Algorithms are developed to interface directly with coordinate measurement machine controlling software. Currently, the metrology systems developed in this project are being used in the verification of parts on actual production lines.

The research in the measurement ofrapid prototyped parts involves the use of a laser scanning system to validate complex geometries produced in the rapid prototyping process. Data points generated from the scanner are directly compared with computer-aided design models to confirm that the part produced matches the design model.

The project in real-time bearing diagnostic systems addresses diagnostics of rolling element bearings via advanced signal processing
techniques. Currently, the test facilities employ standard accelerometers, proximity sensors, and acoustic emission sensors, as well as a newly developed contact potential difference probe.

Dr. Kurfess' research receives funding from The Torrington Company, Proctor & Gamble, The Timken Company, the National Science Foundation, and the Office of Naval Research.

 

 

 

 

  • Association for Manufacturing Technology Charles F. Carter, Jr. Advancing Manufacturing Award, 2005
  • American Society of Mechanical Engineers
    - Fellow, 2004
    - Japan-U.S.A. Symposium on Flexible Automation Program Committee Chair, 2004
    - Gustus L. Larson Memorial Award, 2002
    - Blackall Machine Tool and Gage Award, 2001
    - Journal of Manufacturing Science and Engineering Associate Editor, 1999-present
    - Journal of Dynamic Systems, Measurement, and Control and the Journal of Manufacturing Systems Associate Editor, 1996-2000
    - ASME/Pi Tau Sigma Gold Medal Award, 1995
  • Georgia Insitute of Technology
    - Outstanding Faculty Leadership for the Development of Graduate Research Assistants Award, 2002
    - Class of 1940 W.Roane Beard Outstanding Teacher Award, 2000
  • National Science Foundation
    - Presidential Faculty Fellowship, 1993-1998
    - Presidential Young Investigator Award, 1992-1997
  • Society of Manufacturing Engineers
    - North American Research Institute Board of Directors, 2002-present
    - Journal of Manufacturing Processes Associate Editor, 1999-present
    - Philip R. Marsilius Outstanding Young Manufacturing Engineer Award, 1996
  • International Journal of Engineering Education, Editorial Advisory Board, 2002-present
  • George Tallman Ladd Award for Excellence in Research, (College of Engineering), Carnegie Mellon University, 1992
  • North American Manufacturing Research Conference Co-Chair (with Steven Liang), 1996-1998
  • International Symposium for Automotive Technology and Automation Conference Best Paper Award,Stuttgart, Germany, 1995
  • Registered Professional Engineer in Pennsylvania

Publications

  • T. R. Kurfess (Ed.). 2005. Robotics and Automation Handbook . CRC Press, Inc., Boca Raton, Florida.
  • D. Chinn, et al. 2004. Three-Dimensional Im a ging of Liga-Made Microcomponents. ASME Journal of Manufacturing Science and Engineering 126 (4), 813-821.
  • B. Kim, et al. 2004. Scanning Grating Microinterferometer for MEMS
  • Metrology. ASME Journal of Manufacturing Science and Engineering 126 (4), 807-812.
  • J. F. Nichols and T. R. Kurfess. 2004. Metrology of High Aspect Ratio MEMS. Journal of Microsystem Technologies 10 (6), 556-559.

Patents

  • Microinterferometer for Distance Measurements, U. S. Patent 6,643,025, with F. Degertekin, B. Kim, and H. Ali Razavi, November 4, 2003
  • Microinterferometer for Measuring Distance with Improved Sensitivity. U.S. Patent 6,753,969, with F. L. Degertekin, B. Kim, and A. Razavi, June 22, 2004